High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy
نویسندگان
چکیده
منابع مشابه
High-resolution noncontact atomic force microscopy.
Progress in nanoscience and nanotechnology requires tools that enable the imaging and manipulation of matter at the atomic and molecular scale. During the last two decades or so, scanning probe-based techniques have proven to be particularly versatile in this regard. Among the various probe-based approaches, atomic force microscopy (AFM) stands out in many ways, including the total number of ci...
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No other method has opened the door to progress in nanoscience and nanotechnology as much as the introduction of scanning probe methods did in the 1980s, since they offer a way to visualize the nanoworld. For maximum impact, however, the ability to image and manipulate individual atoms is the key. Initially, scanning tunneling microscopy was the only scanningprobe-based method that was able to ...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2003
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.1593786